Metrology is, by definition, one of the oldest open-source projects – standards are of no use unless they are shared. But it also has had significant barriers to participation, with advanced (and expensive) equipment used in national laboratories, and proprietary commercial data sets. A range of new technologies are now leading to open metrology practices that are significantly expanding access with faster/better/cheaper tools, which are being used in a range of critical applications. This event, hosted by MIT's Center for Bits and Atoms with support from NIST, will gather this emerging community to explore both the opportunities and challenges for anyone being able to measure (almost) anything. The meeting will be hosted in person, with videos shared afterward. It is open, but attendance requires registration.